High-Resolution Studies of Grain Boundary Structure in Yttria-Stabilized Cubic Zirconia Thin Films Grown by MOCVD

1998 ◽  
Vol 166 (1) ◽  
pp. 73-89 ◽  
Author(s):  
K. L. Merkle ◽  
G.-R. Bai ◽  
Z. Li ◽  
C.-Y. Song ◽  
L. J. Thompson
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Grain Boundary ◽  
Boundary Structure ◽  
Cubic Zirconia ◽  
Grain Boundary Structure

Rodrigues-Frank Space Representations of Fiber Texture

1995 ◽  
Vol 403 ◽  
Author(s):  
Krishna Rajan ◽  
Ronald Petkie
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Crystallographic Orientation ◽  
Fiber Texture ◽  
Boundary Structure ◽  
Structure Information ◽  
Grain Boundary Structure ◽  
Specific Determination

AbstractThe concept of fcc fiber texture is examined in the context of Rodrigues-Frank (R-F) representations. Using fiber texture in thin films as the basis of our analysis, it is shown that this approach when combined with grain specific determination of crystallographic orientation provides a useful means of detecting a number of texture components with relatively small grain sampling densities. The application of R-F representations is also shown to be a useful methodology to couple grain boundary structure information with microtexture data.

A comparative HVEM study of ICB-deposited aluminum films

1989 ◽  
Vol 47 ◽  
pp. 642-643
Author(s):  
K.H. Westmacott ◽  
U. Dahmen
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
High Resolution ◽  
Video Camera ◽  
Boundary Structure ◽  
Cluster Beam ◽  
Aluminum Films ◽  
Grain Boundary Structure ◽  
Potential Use

The Ionized Cluster Beam (ICB) technique pioneered by Takagi and colleagues in Kyoto is an exciting new method for depositing thin films possessing novel microstructures and unusual properties, (see for example Ref. 1 for a review of recent work). These materials are of interest not only for their potential use in electronic applications but also because of their eminent suitability for fundamental high resolution studies of grain boundary structureThe HVEM's at the National Center for Electron Microscopy are employed in a complementary fashion to characterize fully the microstructure of ICB deposited Al films. In-situ annealing studies of the films are conducted in the 1.5 MeV Kratos HVEM taking advantage of its heating stage, excellent specimen chamber vacuum (10-8 torr), and high resolution video camera. The increased penetration at 1.5 MeV allows different film thicknesses of Al film to be examined as well as the regions of the foil where the silicon substrate remains backing the Al film. High resolution studies of the atomic structure of grain boundaries are performed on the 1 MeV JEOL ARM using its unique tilting stage and ability to image structures at the 0.15 nm level.

Grain boundary structure in TiO2-excess barium titanate

1998 ◽  
Vol 13 (12) ◽  
pp. 3449-3452 ◽  
Author(s):  
Takahisa Yamamoto ◽  
Yuichi Ikuhara ◽  
Katsuro Hayashi ◽  
Taketo Sakuma
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Grain Boundary ◽  
High Resolution Electron Microscopy ◽  
Growth Behavior ◽  
Boundary Structure ◽  
Grain Boundary Structure ◽  
Resolution Electron ◽  
Grain Growth Behavior ◽  
Electron Energy Loss

Grain boundary structure was examined in 0.1 mol% TiO2-excess BaTiO3 by high-resolution electron microscopy (HRTEM) and electron energy loss spectroscopy (EELS). Their grain boundaries were mostly faceted with {210} type habit. The faceted boundaries were characterized to be associated with an extra Ti–O2 bond with the rutile-like structure. The grain growth behavior in a small TiO2-excess BaTiO3 is discussed from the viewpoint of grain boundary structure.

Grain-boundary structure of thin films of YBa2Cu3O7 and Bi2Sr2CaCu2O8 on bicrystalline substrates

1994 ◽  
Vol 231 (1-2) ◽  
pp. 123-130 ◽  
Author(s):  
B. Kabius ◽  
J.W. Seo ◽  
T. Amrein ◽  
U. Dähne ◽  
A. Scholen ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Boundary Structure ◽  
Grain Boundary Structure

Two Investigations into Grain Boundary Structure

1977 ◽  
Vol 35 ◽  
pp. 688-691
Author(s):  
P. Humble
Keyword(s):  
Grain Boundary ◽  
Dark Field ◽  
Boundary Structure ◽  
Boundary Dislocation ◽  
Bright Field ◽  
Intrinsic Structure ◽  
Weak Beam ◽  
Grain Boundary Structure ◽  
Independent Information ◽  
Diffraction Patterns

There has been sustained interest over the last few years into both the intrinsic (primary and secondary) structure of grain boundaries and the extrinsic structure e.g. the interaction of matrix dislocations with the boundary. Most of the investigations carried out by electron microscopy have involved only the use of information contained in the transmitted image (bright field, dark field, weak beam etc.). Whilst these imaging modes are appropriate to the cases of relatively coarse intrinsic or extrinsic grain boundary dislocation structures, it is apparent that in principle (and indeed in practice, e.g. (1)-(3)) the diffraction patterns from the boundary can give extra independent information about the fine scale periodic intrinsic structure of the boundary.In this paper I shall describe one investigation into each type of structure using the appropriate method of obtaining the necessary information which has been carried out recently at Tribophysics.

Relationships Between Grain Boundary Structure and Material Properties

1980 ◽  
Vol 38 ◽  
pp. 366-369
Author(s):  
Brian Ralph ◽  
Barlow Claire ◽  
Nicola Ecob
Keyword(s):  
Grain Boundary ◽  
Material Properties ◽  
Main Property ◽  
Grain Structure ◽  
Boundary Structure ◽  
Grain Boundary Structure ◽  
Property Changes

This brief review seeks to summarize some of the main property changes which may be induced by altering the grain structure of materials. Where appropriate an interpretation is given of these changes in terms of current theories of grain boundary structure, and some examples from current studies are presented at the end of this paper.

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